Method of forming a sample image and charged particle beam apparatus
View Patent ↗An object of the present invention is to provide a sample image forming method and a charged particle beam apparatus which are suitable for realizing suppressing of the view area displacement with high accuracy while the influence of charging due to irradiation of the charged particle beam is being suppressed. In order to attain the above object, the present invention provide a method of forming a sample image by scanning a charged particle beam on a sample and forming an image based on secondary signals emitted from the sample, the method comprising the steps of forming a plurality of composite images by superposing a plurality of images obtained by a plurality of scanning times; and forming a further composite image by correcting positional displacements among the plurality of composite images and superposing the plurality of composite images, and a charged particle beam apparatus for realizing the above method.
1. A method of measuring a dimension of sample by irradiating a charged particle beam on a sample, and measuring a dimension of a measured object formed on said sample based on secondary signals emitted from said sample, the method comprising the steps of:
wherein said measured object shrinks when irradiated plural times with said charged particle beam, the shrinkage of said measured object increasing as the number of irradiation times increase;
measuring, a dimension of another object having a condition essentially equivalent to the measured object by irradiating the charged particle beam instead of the measured object, wherein said condition is that said another object shrinking the same as said measured object shrinks by irradiating the charged particle beam; and
calculating a relation between an increment in the number of irradiation times and decrements in dimension of said another object, measured plural times after shrinkage; and
estimating the dimension of said measured object before shrinkage, based on the dimension of said another object before shrinkage, estimated from the calculated relation of said another object.