Charged particle beam apparatus
View Patent ↗An object of this invention is to provide a charged particle beam apparatus that is capable of handling samples without adhering impurities onto the samples. In a scanning electron microscope in which a lubricant was coated on a sliding portion of a movable member that moves inside a vacuum chamber, a substance from which low molecular components were removed is used as the lubricant. It is thus possible to inhibit sample contamination and suppress the occurrence of defects in a process following measurement of the samples.
1. A charged particle beam apparatus comprising:
a charged particle beam for irradiating a sample;
a detector for detecting charged particles released from the sample;
a vacuum chamber that surrounds the sample; and
a detection apparatus which detects one or more substances selected from the group consisting of aliphatic hydrocarbon-based substances, phthalate substances, perfluoropolyether-based substances inside the vacuum chamber, and a component included in a lubricant used inside the vacuum chamber;
wherein the detection apparatus includes a spectrophotometer.
2. The charged particle beam apparatus according to claim 1 , further comprising a display apparatus which displays a detection result of the detection apparatus.
3. The charged particle beam apparatus according to claim 1 , wherein the detection apparatus detects a molecular weight of the detected substances.
4. The charged particle beam apparatus according to claim 1 , wherein the detection apparatus includes a storage media which stores changes over time to a molecular weight of the detected substances.
5. The charged particle beam apparatus according to claim 1 , wherein the spectrophotometer is a quadrupole mass spectrophotometer.
6. The charged particle beam apparatus according to claim 1 , wherein the spectrophotometer is an infrared spectrophotometer.
7. The charged particle beam apparatus according to claim 1 , wherein the spectrophotometer is an ellipsometer.
8. The charged particle beam apparatus according to claim 1 , wherein the detection apparatus uses a quartz resonator microbalance as a detector.
9. A sample measurement method performing a sample measurement by a charged particle beam during a semiconductor production process, comprising:
detecting one or more substances released from a sample inside a vacuum chamber of an apparatus performing the sample measurement, wherein the substances are selected from the group consisting of aliphatic hydrocarbon-based substances, phthalate substances, perfluoropolyether-based substances, and a component included in a lubricant used inside the vacuum chamber;
moving sample to a next semiconductor production process after a washing process, when the substances are detected at or above a predetermined value; and
moving the sample to a next semiconductor production process without washing, when the substances are not detected.
10. The method according to claim 9 , wherein when the substances are not detected or detected below a predetermined value, the sample is moved to a next semiconductor production process without a washing process.
11. The method according to claim 9 , wherein the next semiconductor production process a resist coating process.
12. A sample measurement method performing a sample measurement by a charged particle beam during a semiconductor production process, comprising:
moving the sample to a next semiconductor production process without the washing process of the sample, when a measurement by a charged particle beam apparatus which uses a lubricant from which low molecular components are removed is performed, and
moving the sample to a next semiconductor production process after the washing process of the sample, when a measurement by a charged particle beam apparatus which uses a lubricant from which low molecular components are not removed is performed.
13. The method according to claim 12 , wherein the next semiconductor production process is a resist coating process.