IP Library › Granted Patent US 635,167
Granted Patent S1
US 635,167 · App. 29/356,716 · Granted Mar 29, 2011

Portion of an electron microscope

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Quick Facts
Patent No.
US 635,167
App. No.
29/356,716
Granted
Mar 29, 2011
Kind
S1
Claims (1)

We claim the ornamental design for a portion of an electron microscope, as shown and described.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 2, 2010
From: OONUMA, MITSURU; OMACHI, AKIRA; AJIMA, MASAHIKO; OHTAKI, TOMOHISA
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 024011/0216 →