Electron microscope and sample holder
View Patent ↗The electron beam apparatus sample holding means has a diaphragm which is placed on upper and lower sides of a sample to form a cell for separating a gas atmosphere and a vacuum atmosphere of a sample chamber and sealing an ambient atmosphere of the sample; a gas supply means for supplying gas to an inside of the cell; and exhaust means for exhausting gas. The exhaust means includes a gas exhaust pipe provided in the inside of the cell and an openable/closable exhaust hole provided in a sidewall of the sample holding means so as to pass through the cell. The diaphragm is an amorphous film made of light elements which can transmit an electron beam, such as carbon films, oxide films, and nitride films.
1. An electron microscope, comprising:
a sample holder for holding a sample;
a sample chamber for maintaining a surrounding area of the sample in a vacuum atmosphere;
an electron beam control unit for focusing an electron beam emitted from an electron source which emits a primary electron beam and irradiating the sample with the electron beam;
a detector for detecting electrons generated from the sample;
a sample image control unit for forming a sample image relating to the sample based on a signal from the detector;
a display unit for displaying the sample image;
a recording unit for recording the sample image;
a cell which includes diaphragms placed relative to upper and lower sides of the sample, which is held on the sample holder, for separating the vacuum atmosphere and a gas atmosphere of the sample chamber;
a gas supply unit for supplying gas to an inside of the cell; and
a gas exhaust unit for exhausting the gas from the inside of the cell,
wherein:
the gas exhaust unit includes a gas exhaust pipe provided in the inside of the cell and an exhaust hole provided in a sidewall of the sample holder,
the exhaust hole is positioned in the inside of the sample chamber when the sample holder is inserted,
the sample holder includes a seal member for sealing the exhaust hole,
the exhaust hole is opened and closed by contact with the seal member as the sample holder moves, and
the gas in the inside of the cell can be exhausted through both the gas exhaust pipe and the exhaust hole when the sample holder is inserted into or taken out of the sample chamber.
2. The electron microscope according to claim 1 , comprising:
a pressure control unit for controlling pressure of the gas in the inside of the cell; and
a heating unit for heating the sample in the inside of the cell.
3. The electron microscope according to claim 1 , wherein
the exhaust hole provided in the sidewall of the sample holder is a singular hole.
4. The electron microscope according to claim 1 , wherein
the exhaust hole provided in the sidewall of the sample holder as one of a plurality of exhaust holes provided in the sidewall of the sample holder.
5. The electron microscope according to claim 1 , wherein the sample holder includes:
a shaft having an outer shaft and a center shaft, the outer shaft including the sidewall and the exhaust hole provided thereon; and
a needle valve is provided on a center shaft of the sample holder so as to control a flow rate of the gas at a time of opening and closing the exhaust hole.
6. A sample holder for holding a sample for use in an electron microscope which irradiates the sample with an electron beam to detect electrons generated on the sample and to form an image, comprising:
a cell which includes diaphragms placed relative to upper and lower sides of the sample for separating a vacuum atmosphere and a gas atmosphere;
a gas exhaust pipe provided in an inside of the cell; and
an exhaust hole provided in a casing of the cell that has the diaphragms coupled thereto,
wherein:
the exhaust hole is positioned in the inside of the sample chamber when the sample holder is inserted,
the sample holder includes a seal member for sealing the exhaust hole,
the exhaust hole is opened and closed by contact with the seal member as the sample holder moves, and
gas in the inside of the cell can be exhausted through both the gas exhaust pipe and the exhaust hole when the cell is inserted into or taken out of the vacuum atmosphere.
7. The sample holder according to claim 6 , comprising a heating unit provided in the inside of the cell for heating the sample.
8. The sample holder according to claim 6 , wherein
the exhaust hole is a singular hole.
9. The sample holder according to claim 6 , wherein
the exhaust hole is a plurality of holes.
10. The sample holder according to claim 6 , further comprising:
a shaft having an outer shaft and a center shaft, the outer shaft having the exhaust hole provided thereon; and
a needle valve disposed on the center shaft so as to control a flow rate of the gas at a time of opening and closing the exhaust hole.
11. An electron microscope, comprising:
a sample holder for holding a sample;
a sample chamber for maintaining a surrounding area of the sample in a vacuum atmosphere;
an electron beam control unit for focusing an electron beam emitted from an electron source which emits a primary electron beam and irradiating the sample with the electron beam;
a detector for detecting electrons generated from the sample;
a sample image control unit for forming a sample image relating to the sample based on a signal from the detector;
a display unit for displaying the sample image;
a recording unit for recording the sample image;
a cell which includes diaphragms placed relative to upper and lower sides of the sample, which is held on the sample holder, for separating the vacuum atmosphere and a gas atmosphere of the sample chamber;
a gas supply unit for supplying gas to an inside of the cell; and
a gas exhaust unit for exhausting the gas from the inside of the cell,
wherein:
the gas exhaust unit includes a gas exhaust pipe provided in the inside of the cell and an openable and closeable exhaust hole provided in a sidewall of the sample holder so as to pass through the cell, and gas in the inside of the cell can be exhausted through both the gas exhaust pipe and the exhaust hole, and
the sample holder has a shaft, the shaft has an outer shaft and a center shaft and the outer shaft has the exhaust hole provided thereon so that gas in the inside of the cell is exhausted as the center shaft moves.
12. The electron microscope according to claim 11 , wherein
a needle valve is provided on the center shaft of the sample holder so as to control a flow rate of the gas at a time of opening and closing the exhaust hole.
13. A sample holder for holding a sample for use in an electron microscope which irradiates the sample with an electron beam to detect electrons generated on the sample and to form an image, comprising:
a cell which includes diaphragms placed relative to upper and lower sides of the sample for separating a vacuum atmosphere and a gas atmosphere;
a gas exhaust pipe provided in an inside of the cell; and
an openable and closeable exhaust hole provided so as to pass through the cell; and
a shaft having an outer shaft and a center shaft, the outer shaft having the exhaust hole provided thereon,
wherein gas in the inside of the cell can be exhausted through both the gas exhaust pipe and the exhaust hole as the center shaft moves.
14. The sample holder according to claim 13 , wherein
a needle valve is provided on the center shaft so as to control a flow rate of the gas at a time of opening and closing the exhaust hole.