IP Library Granted Patent US 8,457,926
Granted Patent B2
US 8,457,926 · App. 12/841,599 · Granted Jun 4, 2013

Disk protrusion detection/flatness measurement circuit and disk glide tester

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Quick Facts
Patent No.
US 8,457,926
App. No.
12/841,599
Granted
Jun 4, 2013
Kind
B2
Abstract

The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.

Claims (19)

1. A disk protrusion detection/flatness measurement circuit comprising:

a protrusion detection sensor;

an amplifier circuit for amplifying a signal from the protrusion detection sensor;

an A/D conversion circuit for converting a detection signal amplified by the amplifier circuit, from an analog signal to a digital signal; and

a data processing circuit comprising:

a band-pass filter block for filtering a digital signal received from the A/D conversion circuit with at least a predetermined bandwidth;

a peak detection process block for detecting a peak value based on the signal received from the band-pass filter block and providing an output based on the detected peak value and representing a disk protrusion measurement; and

an average value calculation process block for calculating an average value of the signal received from the band-pass filter block within a track or a sector of a disk and providing an output based on the calculated average value and representing a flatness measurement.

2. The disk protrusion detection/flatness measurement circuit according to claim 1 , wherein the data processing circuit is made up by an FPGA, further comprising a pass/fail decision process block for deciding a pass/fail of the disk based on the peak value and the average value.

3. A disk glide tester comprising:

a disk protrusion detection/flatness measurement circuit, including:

a protrusion detection sensor;

an amplifier circuit for amplifying a signal from the protrusion detection sensor;

an A/D conversion circuit for converting a detection signal amplified by the amplifier circuit, from an analog signal to a digital signal; and

a data processing circuit comprising:

a band-pass filter block for filtering a digital signal received from the A/D conversion circuit with at least a predetermined bandwidth;

a peak detection process block for detecting a peak value based on the signal received from the band-pass filter block and providing an output based on the detected peak value and representing a disk protrusion measurement; and

an average value calculation process block for calculating an average value of the signal received from the band-pass filter block within a track or a sector of a disk and providing an output based on the calculated average value and representing a flatness measurement.

4. The disk glide tester according to claim 3 , wherein the data processing circuit is made up by an FPGA, further comprising a pass/fail decision process block for deciding a pass/fail of the disk based on the peak value and the average value.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2010
From: SHITARA, KENICHI; TOKUMARU, YASUHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 024781/0960 →