IP Library Assignment 024781/0960
Patent Assignment
Reel/Frame 024781/0960

Assignment of Assignor's Interest

Recorded: 2010-08-03 Pages: 2
Assignors
SHITARA, KENICHI
Executed: 2010-06-21
TOKUMARU, YASUHIRO
Executed: 2010-06-21
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME,, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Disk Protrusion Detection/Flatness Measurement Circuit and Disk Glide Tester
Patent: 8,457,926 →
Application: 12/841,599 →
Publication: US 2011/0051580
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →