Scanning electron microscope
View Patent ↗Conventionally, in a general-purpose scanning electron microscope, the maximum accelerating voltage which can be set is low, and hence thin crystal samples which can be observed under normal high-resolution observation conditions are limited to samples with large lattice spacing. For this reason, there has no means for accurately performing magnification calibration. As means for solving this problem, the present invention includes an electron source which generates an electron beam, a deflector which deflects the electron beam so as to scan a sample with the electron beam, an objective lens which focuses the electron beam on the sample, a detector which detects an elastically scattered electron and an inelastically scattered electron which are transmitted through the sample, and an aperture disposed between the sample and the detector to control detection angles of the elastically scattered electron and the inelastically scattered electron. The electron beam enters the sample at a predetermined convergence semi-angle, and a lattice image is acquired at a second convergence semi-angle larger than a first convergence semi-angle at which a beam diameter is minimized on the sample.
1. A scanning transmission electron microscope comprising:
an electron source which generates an electron beam;
a deflector which deflects the electron beam so as to scan a sample with the electron beam;
an objective lens which focuses the electron beam on the sample;
a detector which detects a scanning transmission electron transmitted through the sample; and
an aperture which is disposed between the sample and the detector to control a detection angle of the scanning transmission electron,
wherein the electron beam enters the sample at a predetermined convergence semi-angle, and
a lattice image is acquired at a second convergence semi-angle larger than a first convergence semi-angle at which a beam diameter is minimized on the sample.
2. The scanning transmission electron microscope according to claim 1 ,
wherein the second convergence semi-angle is larger than twice a Bragg angle θ B .
3. The scanning transmission electron microscope according to claim 2 ,
wherein the first convergence semi-angle is smaller than twice the Bragg angle θ B .
4. The scanning transmission electron microscope according to claim 1 ,
wherein a maximum accelerating voltage of the electron beam is 30 kV or less.
5. The scanning transmission electron microscope according to claim 1 ,
wherein the detector detects a signal amount originating from an interference pattern caused by interference between an elastically scattered electron and an inelastically scattered electron included in the scanning transmission electron, and includes a calculation unit which detects an intensity change of the signal amount by scanning the sample with the electron beam and obtains a crystal lattice spacing of the sample from the intensity change.
6. The scanning transmission electron microscope according to claim 1 , further comprising:
a storage unit which stores the second convergence semi-angle, the detection angle, and a focus value of the objective lens for each sample as conditions for acquiring the lattice image in advance.
7. The scanning transmission electron microscope according to claim 1 ,
wherein a crystal lattice spacing of the sample is obtained from the lattice image, and magnification calibration is performed based on the crystal lattice spacing.
8. The scanning transmission electron microscope according to claim 5 ,
wherein a crystal lattice spacing of the sample is obtained from the lattice image, and magnification calibration is performed based on the crystal lattice spacing.