Image forming method and charged particle beam apparatus
View Patent ↗An image forming method and a charged particle beam apparatus suitable for suppressing the inclination of charging when scanning a two-dimensional area with a charged particle beam. A third scanning line located between a first scanning line and a second scanning line is scanned. After the first, second and third scanning lines have been scanned, a plurality of scanning lines are scanned between the first and third scanning lines and between the second and third scanning lines.
1. An image forming method for scanning a two-dimensional area on a sample with a charged particle beam and forming an image of the scanning area, the image forming method comprising the steps of:
scanning a first scanning line located at top of the two-dimensional area on the sample, a second scanning line located at bottom of the two-dimensional area, and scanning a third scanning line located on a center between the first scanning line and the second scanning line;
scanning new scanning lines located on center lines of first scanning line intervals prescribed by the first and third scanning lines and the second and third scanning lines, scanning further new scanning lines located on center lines of second scanning line intervals prescribed by the first, second and third scanning lines and the new scanning lines formed between the first and third scanning lines and between the second and third scanning lines, repeating scanning new scanning lines located on center lines between already scanned scanning lines, and thereby scanning the two-dimensional area.
2. An image forming method according to claim 1 , wherein further new scanning lines located on center lines between the scanning lines located on the center lines of second scanning line intervals and the scanning lines prescribing the second scanning line intervals are scanned.
3. An image forming method according to claim 1 , wherein
in the two-dimensional area, the second scanning line is located at the longest distance from the first scanning line, and
the third scanning line and the new scanning lines are located on center lines between scanning lines scanned before.
4. A charged particle beam apparatus including deflectors for scanning a sample with a charged particle beam and a controller for controlling the deflectors, wherein
the controller controls the deflectors to scan a first scanning line located at top of a two-dimensional area on the sample, a second scanning line located at bottom of the two-dimensional area, and scan a third scanning line located on a center of the two-dimensional area and between the first scanning line and the second scanning line;
the controller controls the deflectors to scan new scanning lines located on center lines of first scanning line intervals prescribed by the first and third scanning lines and the second and third scanning lines, scan further new scanning lines located on center lines of second scanning line intervals prescribed by the first, second and third scanning lines and the new scanning lines formed between the first and third scanning lines and between the second and third scanning lines, repeat scanning new scanning lines located on center lines between already scanned scanning lines, and thereby scan the two-dimensional area.
5. A charged particle beam apparatus according to claim 4 , wherein the controller controls the deflectors to scan further new scanning lines located on center lines between the scanning lines located on the center lines of second scanning line intervals and the scanning lines prescribing the second scanning line intervals.
6. A charged particle beam apparatus according to claim 4 , wherein
the controller controls the deflectors to locate, in the two-dimensional area, the second scanning line at the longest distance from the first scanning line, and
the controller controls the deflectors to locate the third scanning line and the new scanning lines on center lines between scanning lines scanned before.