Scanning electron microscope
A scanning electron microscope capable of properly determining a step of a step pattern formed on a sample regardless of combination of material of a groove of the step pattern and material of a projection of the step pattern, the scanning electron microscope includes a beam source, a detection unit having a first detection unit that detects a secondary electron emitted from the sample at an angle between an optical axis direction of the primary electron beam which is equal to or less than a predetermined value, and a second detection unit that detects a secondary electron emitted from the sample at an angle between the optical axis direction of the primary electron beam which is greater than the predetermined value, and a processing unit to obtain information on the step pattern using the information on a ratio between signals outputted from the first and the second detection unit.
1. A scanning electron microscope comprising:
a beam source that irradiates a primary electron beam;
a detection unit that detects secondary electrons generated from a measurement object by irradiation of the primary electron beam to the measurement object; and
a processing unit that processes a signal detected with the detection unit,
wherein the detection unit has:
a first detection unit that detects a secondary electron at an angle between an optical axis direction of the primary electron beam irradiated to the measurement object and an emission direction of the secondary electron from the measurement object equal to or less than a predetermined value; and
a second detection unit that detects the secondary electron at an angle between the optical axis direction of the primary electron beam irradiated to the measurement object and the emission direction of the secondary electron from the measurement object greater than the predetermined value, and
wherein the processing unit obtains a ratio between signals outputted from the first detection unit and the second detection unit, and obtains information on a step pattern formed on the measurement object by using information on the obtained ratio.
2. The scanning electron microscope according to claim 1 , wherein the processing unit extracts a signal maximum region of a signal obtained by detecting the secondary electrons with the first detection unit, and determines the step pattern using the information on the ratio between the signal obtained by detecting the secondary electrons with the first detection unit and a signal obtained by detecting the secondary electrons with the second detection unit in the extracted signal maximum region.
3. The scanning electron microscope according to claim 2 , wherein the processing unit determines the step pattern based on previously set determination conditions, from an increase/decrease tendency of the ratio between the signal obtained by detecting the secondary electrons with the first detection unit and the signal obtained by detecting the secondary electrons with the second detection unit in the extracted signal maximum region.
4. The scanning electron microscope according to claim 1 , further comprising an output unit having a screen,
wherein an image obtained by detecting the secondary electrons generated from the measurement object with the detection unit as well as information on the step pattern formed in the measurement object obtained with the processing unit are displayed on the screen.
5. The scanning electron microscope according to claim 1 , further comprising a memory unit that holds relationship between information on the ratio between a signal obtained by detecting the secondary electrons with the first detection unit and a signal obtained by detecting the secondary electrons with the second detection unit, and an opening angle of a groove of the step pattern,
wherein a depth of the groove of the step pattern is obtained, using the information on the ratio obtained with the processing unit, based on the relationship between the information on the ratio and the opening angle of the groove of the step pattern stored in the memory unit.
6. A scanning electron microscope comprising:
a beam source that irradiates a primary electron beam;
a detection unit that detects secondary electrons generated from a measurement object by irradiation of the primary electron beam to the measurement object; and
a processing unit that processes a signal detected with the detection unit,
wherein the detection unit has:
a first detection unit that detects secondary electrons generated from the measurement object; and
a second detection unit that detects tertiary electrons generated by collisions of the secondary electrons against a reflector, wherein the second detection unit is provided on the measurement object side with respect to the beam source; and
wherein the processing unit obtains a ratio between signals outputted from the first detection unit and the second detection unit, and obtains information on a step pattern formed in the measurement object by using information on the obtained ratio.
7. The scanning electron microscope according to claim 6 , wherein the processing unit obtains central coordinates of a groove of the step pattern formed in the measurement object from the signals outputted from the first detection unit and the second detection unit, and obtains a ratio between the signals outputted from the first detection unit and the second detection unit at the obtained central coordinates.
8. The scanning electron microscope according to claim 7 , further comprising a memory unit that holds relation between information on the ratio between a signal obtained by detecting the secondary electrons with the first detection unit and a signal obtained by detecting the secondary electrons with the second detection unit and an opening angle of the groove of the step pattern,
wherein the processing unit obtains the opening angle of the step pattern formed in the measurement object from the relationship between the information on the ratio and the opening angle of the groove of the step pattern, stored in the memory unit, using the information on the ratio between the signals outputted from the first detection unit and the second detection unit at the obtained central coordinates.
9. The scanning electron microscope according to claim 8 , wherein the processing unit obtains a width of the groove of the step pattern formed in the measurement object from the signal outputted from the first detection unit, and obtains information on the step pattern formed in the measurement object by using the obtained information on width of the groove of the step pattern and the obtained information on the opening angle of the step pattern formed in the measurement object.
10. The scanning electron microscope according to claim 6 , further comprising an output unit having a screen,
wherein an image obtained by detecting the secondary electrons generated from the measurement object with the detection unit as well as information on the step pattern formed in the measurement object obtained with the processing unit are displayed on the screen.