Contamination-inspecting apparatus and detection circuit
View Patent ↗The detection part has: a subtraction module for calculating correction data from data of detection systems when a reference-voltage generation module applies a reference voltage to the detection systems; a data-holding module for holding the correction data; an addition module for making a correction of detection data; a comparison module for comparing the detection data with switching data; and a selector for switching data of the detection systems including data subjected to the correction according to the output of the comparison module.
1. A contamination-inspecting apparatus for inspecting a wafer surface for a contaminant comprising:
an irradiation optical system for irradiating the wafer surface with laser light;
a detection optical system for detecting light scattered from the wafer surface; and
a detection unit for converting the scattered light detected with the detection optical system into an electric signal to make a correction;
wherein the detection unit has a plurality of detection circuits with different amplification factors; and
wherein the detection unit has a means for correcting the electric signal by use of a piece of correction data derived from a difference in amplification factor between the plurality of detection circuits and held in advance; and
wherein the detection unit has a switching means for switching between a piece of output data of a first detection circuit and a piece of data output by a second detection circuit and then corrected based on the piece of correction data thereby to selectively output the pieces of data, provided that the first and second detection circuits are each one of the plurality of detection circuits.
2. The contamination-inspecting apparatus according to claim 1 , wherein the switching means performs the switching based on a result of comparison with a piece of preset switching data.
3. The contamination-inspecting apparatus according to claim 2 , wherein the switching means compares the piece of preset switching data with the piece of output data of the first detection circuit, and performs the switching according to a relation between magnitudes of the pieces of data.
4. The contamination-inspecting apparatus according to claim 1 , wherein the first detection circuit has a first amplification means, and a first analog-to-digital conversion circuit for sampling an output of the first amplification means,
the second detection circuit has a second amplification means, and a second analog-to-digital conversion circuit for sampling an output of the second amplification means, and
the piece of correction data is calculated from a piece of output data of the first analog-to-digital conversion circuit and a piece of output data of the second analog-to-digital conversion circuit when a reference voltage is applied to the first and second amplification means.
5. A detection circuit which detects a voltage and outputs a code corresponding to the voltage, comprising:
a reference-voltage generation means for producing and outputting a reference voltage;
a switching means for performing switching between an input to the detection circuit and an output of the reference-voltage generation means;
a first amplification means for amplifying an output of the switching means;
a first analog-to-digital conversion circuit for sampling an output of the first amplification means;
a second amplification means for amplifying the output of the switching means;
a second analog-to-digital conversion circuit for sampling an output of the second amplification means;
a computing means for calculating a piece of correction data from a piece of output data of the first analog-to-digital conversion circuit and a piece of output data of the second analog-to-digital conversion circuit when the reference voltage is applied to the first and second amplification means with the switching means;
a correction means for making a correction of a piece of output data of at least one of the first and second analog-to-digital conversion circuits by use of the piece of correction data calculated by the computing means; and
a switching means for switching between the piece of output data of the analog-to-digital conversion circuit and a piece of data resulting from the correction of the piece of output data to selectively output the pieces of data.
6. The detection circuit according to claim 5 , wherein logarithmic conversion is performed on a piece of output data of at least one of the first and second analog-to-digital conversion circuits.
7. The detection circuit according to claim 5 , further comprising a means for logarithmically amplifying an input signal.
8. The detection circuit according to claim 5 , further comprising a comparison means for comparing one of a piece of output data of at least one of the first and second analog-to-digital conversion circuits and a piece of data resulting from the correction of the output data with an appropriate piece of data,
wherein the switching means outputs one of the piece of output data of the analog-to-digital conversion circuit and a piece of data resulting from the correction of the output data, according to a result of the comparison by the comparison means.
9. A contamination-inspecting apparatus for inspecting a wafer surface for a contaminant, comprising:
an irradiation optical system for irradiating the wafer surface with laser light;
a detection optical system for detecting light scattered from the wafer surface; and
a detection unit for converting the scattered light detected with the detection optical system into an electric signal to make a correction,
wherein the detection unit has the detection circuit according to any one of the claims 5 to 8 .