IP Library › Granted Patent US 794,816
Granted Patent S1
US 794,816 · App. 29/488,729 · Granted Aug 15, 2017

Sample holder for an electron microscope

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Quick Facts
Patent No.
US 794,816
App. No.
29/488,729
Granted
Aug 15, 2017
Kind
S1
Claims (1)

We claim the ornamental design for a sample holder for an electron microscope, as shown and described.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 21, 2017
From: KOYAMA, KAZUHIRO; SASAJIMA, MASAHIRO
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 041657/0470 →