Scanning electron microscope
The present invention provides a composite charged particle beam device which is provided with two or more charged particle beam columns and enables high-resolution observation while a sample is placed at the position of a cross point. The present invention has the following configuration. A composite charged particle beam device is provided with a plurality of charged particle beam columns ( 101 a, 102 a ), and is characterized in that a sample ( 103 ) is disposed at the position of an intersection point ( 171 ) where the optical axes of the plurality of columns intersect, a component ( 408 a, 408 b ) that forms the tip of an objective lens of the charged particle beam column ( 102 a ) is detachable, and by replacing the component ( 408 a, 408 b ), the distance between the intersection point ( 171 ) and the tip of the charge particle beam column can be changed.
1. A scanning electron microscope, comprising:
an electron beam column including an objective lens;
wherein the objective lens includes a body and a detachable component that forms a tip.
2. The scanning electron microscope according to claim 1 , wherein the tip of the objective lens is formed of one of a plurality of types of the detachable component that are attachable to the body, and each of the types is made of a different material plated on the component.
3. The scanning electron microscope according to claim 1 , wherein the tip of the objective lens is exchangeable depending on an analysis object.
4. The scanning electron microscope according to claim 1 , further comprising an X-ray detector.
5. The scanning electron microscope according to claim 1 , further comprising a display device for displaying a GUI for operating the scanning electron microscope, the display device being able to display a plurality of types of the component of the objective lens.
6. The scanning electron microscope according to claim 1 , further comprising a display device for displaying a GUI for operating the scanning electron microscope, the display device being able to display a warning that a type of the component is inappropriate.
7. The scanning electron microscope according to claim 1 ,
wherein the body of the objective lens is configured to be attachable to a plurality of types of the component, and each of the types is made of a different material.