Standard member for length measurement, method for producing the same, and electron beam length measuring device using the same
View Patent ↗This invention provides an electron beam length measuring technology including a standard component for length measurement that has a finer standard dimension, and its producing method. The standard component for length measurement has a semiconductor member on which is arranged a pattern consisting of an array of first diffraction gratings whose pitch dimension is specified as an absolute dimension by an optical measurement method, wherein the pattern has a structure in which an array of second diffraction gratings different from the first diffraction gratings is arranged in a portion within the array of the first diffraction gratings in a predetermined cycle. Each one of the first diffraction gratings and the second diffraction gratings has a predetermined length and a predetermined width, respectively. The first diffraction gratings and the second diffraction gratings are arranged cyclically at respective predetermined intervals, and marks for specifying positions of the above-mentioned patterns are arranged in peripheral portions of the above-mentioned patterns. Moreover, the above-mentioned pattern contains an array pattern whose minimum pitch dimension is equal to or less than 100 nm. The electron beam batch exposure method is used as a pattern producing method.
1. A standard component for length measurement, comprising a semiconductor component on which a pattern consisting of an array of first diffraction gratings whose pitch dimension is specified as an absolute dimension by an optical measurement method, wherein
the pattern has a structure that contains an array of second diffraction gratings different from the first diffraction grating in a predetermined cycle in a portion within the array of the first diffraction gratings.
2. A standard component for length measurement, comprising a semiconductor component on which a pattern consisting of an array of first diffraction gratings whose pitch dimension is specified as an absolute dimension by an optical measurement method, wherein
the pattern has a structure that contains an array of second diffraction grating that is different from the first diffraction gratings in terms of at least one of the length of a straight line part of the first diffraction grating, a pitch dimension of the array, and a direction in which the second diffraction gratings is repeated cyclically in such a way that the array of the second diffraction gratings is parallel to and within the array of the first diffraction gratings.
3. The standard component for length measurement according to claim 2 , wherein
the pattern contains an array pattern whose minimum pitch dimension is equal to or less than 100 nm.
4. The standard component for length measurement according to claim 2 , wherein
the first diffraction grating and the second diffraction grating have predetermined lengths and widths, respectively, and are arranged cyclically at predetermined intervals, respectively, and marks for specifying positions of the patterns are arranged in peripheral portions of the pattern.
5. The standard component for length measurement according to claim 2 , wherein the semiconductor component is made up of a Si substrate, and the pattern is a depression-and-projection-shaped pattern that has surfaces of plane directions of the (110) plane and the (111) plane of the Si substrate.
6. A standard component for length measurement, comprising a semiconductor component on which plurality of patterns each consisting of an array of first diffraction gratings whose pitch dimension is specified as an absolute dimension by an optical measurement method, wherein
each of the patterns has a structure that an array of second diffraction gratings different from the first diffraction gratings is arranged in a part within the array of the first diffraction gratings in a predetermined cycle.
7. The standard component for length measurement according to claim 6 , wherein
each of the patterns contains an array pattern whose minimum pitch dimension is equal to or less than 100 nm.
8. The standard component for length measurement according to claim 6 , wherein
the plurality of patterns are arranged two-dimensionally and cyclically at predetermined intervals within a predetermined area, and marks for position detection are arranged between the adjacent patterns of the plurality of patterns.
9. The standard component for length measurement according to claim 6 , wherein
the semiconductor component is made up of a Si substrate, and the pattern is a depression-and-projection-shaped pattern that has surfaces whose plane directions are the (110) plane and the (111) plane of the Si substrate.
10. A method for producing a standard component for length measurement, comprising
the step of forming a pattern consisting of an array of first diffraction gratings whose pitch dimension is specified as an absolute dimension by an optical measurement method on a surface of a semiconductor component, and further comprising the step of forming an array of second diffraction gratings different from the first diffraction gratings in a predetermined cycle in a part within the array of the first diffraction gratings in the pattern by the electron-beam batch exposure method using a stencil mask.
11. The method for producing a standard component for length measurement according to claim 10 , wherein
the pattern formed contains an array pattern whose minimum pitch dimension is equal to or less than 100 nm.
12. The method for producing a standard component for length measurement according to claim 10 , wherein
a Si substrate is used as the semiconductor component, and the pattern formed is a depression-and-projection-shaped pattern that has surfaces whose plane directions are the (110) plane and the (111) plane of the Si substrate.
13. An electron-beam metrology system comprising:
electron beam length measuring means for measuring processing dimensions of a sample by irradiating and scanning an electron beam; and
calibrating means for calibrating a dimension based on a secondary electron signal waveform obtained by scanning the electron beam on a standard component for length measurement; wherein
the standard component for length measurement has an array of first diffraction gratings whose pitch dimension was specified by an optical measurement method as an absolute dimension, and has a pattern that contains an array of second diffraction gratings different from the first diffraction gratings in a fixed period and within the array of the first diffraction gratings.
14. The electron-beam metrology system according to claim 13 , wherein the pattern contains an array pattern whose minimum pitch dimension is equal to or less than 100 nm.
15. The method for producing a standard component for length measurement according to claim 13 , wherein
a Si substrate is used as the semiconductor substrate, and the pattern is a depression-and-projection-shaped pattern that has surfaces whose plane directions are the (110) plane and the (111) plane of the Si substrate.