Electron microscopic inspection apparatus
View Patent ↗Both wafers on which copper wiring was performed and wafers on which non-copper wiring was performed can be inspected by a single unit of electron microscopic inspection apparatus with no possibilities of the wafers being contaminated with copper. All elements within the apparatus that come in contact with wafers, such as hands of a wafer transporter, are duplicated or more and one of the elements that contact wafers is used appropriately for the wafers under inspection which may be either the wafers on which copper wiring was performed or the wafers on which non-copper wiring was performed.
1. An electron microscopic inspection apparatus comprising means for transporting wafers between wafer container means and a main body of the apparatus, aligner means for aligning wafer orientation, and wafer mount means for supporting and moving wafers within the main body of the apparatus, wherein each of the wafer transporting means, the aligner means, and the wafer mount means has a plurality of wafer support elements, and one of the plurality of wafer support elements of the wafer mount means contacts and supports wafers under inspection.
2. The electron microscopic inspection apparatus according to claim 1 , wherein one of the plurality of wafer support elements is used appropriately for a wafer process performed on the wafers under inspection.
3. The electron microscopic inspection apparatus according to claim 1 , wherein one of the plurality of wafer support elements is appointed to support a wafer on which copper wiring was performed and the other of the plurality of wafer support elements is appointed to support a wafer on which non-copper wiring was performed.
4. The electron microscopic inspection apparatus according to claim 1 , wherein one of the plurality of wafer support elements is appointed to support a silicon semiconductor wafer and the other of the plurality of wafer support elements is appointed to support a hybrid semiconductor wafer.
5. The electron microscopic inspection apparatus according to claim 1 , further comprising means for discriminating between types of said wafers in container means and a control unit for controlling said wafer transporting means, said aligner means, and said wafer mount means, wherein said control unit determines one of the plurality of wafer support elements to be used for the wafers under inspection in said wafer transporting means, said aligner means, and said wafer mount means, according to a signal from said discriminating means.
6. The electron microscopic inspection apparatus according to claim 1 , further comprising a control unit for controlling said wafer transporting means, said aligner means, and said wafer mount means, wherein said control unit determines one of the plurality of wafer support elements to be used for the wafers under inspection in said wafer transporting means, said aligner means, and said wafer mount means, according to water process information sent from an external computer.