IP Library Granted Patent US 8,674,299
Granted Patent B2
US 8,674,299 · App. 13/148,732 · Granted Mar 18, 2014

Mass spectrometric system

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,674,299
App. No.
13/148,732
Granted
Mar 18, 2014
Kind
B2
Abstract

A mass spectrometric device of the present invention includes a quadrupole filter ( 12 ) located upstream of a quadrupole ion trap ( 13 ) and configured to transmit ions in a predetermined filter range, and determines the filter range of the quadrupole filter ( 12 ) such that accumulation time for the ions in the quadrupole ion trap ( 13 ) is maximized. The accumulation time for the ions is determined based on mass spectrometry data information. With this configuration, the present invention produces advantageous effects of improving analysis throughput and an S/N ratio in an analysis of a minor sample component mixed in various accompanying components by using the mass spectrometric device using the quadrupole ion trap.

Claims (14)

1. A sample analysis method using a mass spectrometric system including an ion source configured to ionize a sample, a quadrupole filter located at a subsequent stage of the ion source, an ion trap located at a subsequent stage of the quadrupole filter, an ion detector located at a subsequent stage of the ion trap, and a control unit configured to control the quadrupole filter and the ion trap, the method comprising the steps executed by the control unit of:

obtaining mass spectrometry data of the sample by setting the quadrupole filter to allow an ion to transmit therethrough;

selecting a precursor ion in tandem mass spectrometry based on the mass spectrometry data;

setting a filter range of the quadrupole filter to transmit the ion in a range of a predetermined mass to charge ratio, and setting the center of the filter range such that the precursor ion is included in the filter range and that a total ion current transmitted through the quadrupole filter is reduced as compared to a case where the center of the filter range coincides with the precursor ion;

determining accumulation time in the ion trap based on the filter range having the center set and on the mass spectrometry data; and

performing tandem mass spectrometry on the precursor ion in accordance with the determined operating conditions of the quadrupole filter and the ion trap.

2. The sample analysis method according to claim 1 , wherein the control unit sets the center of the filter range such that the total ion current transmitted through the quadrupole filter is minimized.

3. A sample analysis method using a mass spectrometric system including an ion source configured to ionize a sample, a quadrupole filter located at a subsequent stage of the ion source, an ion trap located at a subsequent stage of the quadrupole filter, an ion detector located at a subsequent stage of the ion trap, and a control unit configured to control the quadrupole filter and the ion trap, the method comprising the steps executed by the control unit of:

obtaining mass spectrometry data of the sample by setting the quadrupole filter to allow an ion to transmit therethrough;

selecting a precursor ion in tandem mass spectrometry based on the mass spectrometry data;

setting a filter range of the quadrupole filter to transmit the ion in a range of a predetermined mass to charge ratio and setting the center of the filter range such that the precursor ion is included in the filter range and accumulation time for the ion in the ion trap is longer than in a case where the center of the filter range coincides with the precursor ion;

determining accumulation time in the ion trap based on the filter range having the center set and on the mass spectrometry data; and

performing tandem mass spectrometry on the precursor ion in accordance with determined operating conditions of the quadrupole filter and the ion trap.

4. The sample analysis method according to claim 3 , wherein the control unit determines the center of the filter range such that the accumulation time is maximized.

Assignments (2)
CHANGE OF NAME AND ADDRESS Recorded Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 10, 2011
From: HIRABAYASHI, ATSUMU; SATAKE, HIROYUKI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 026726/0674 →