Defective product inspection apparatus, probe positioning method and probe moving method
View Patent ↗For adjusting a positional relationship between a specimen and a probe to measure an electric characteristic of the specimen through a contact therebetween, a base table holding a specimen table holding the specimen and a probe holder holding the probe is positioned at a first position to measure the positional relationship between the probe and the specimen at the first position, and subsequently positioned at a second position to measure the positional relationship therebetween at the second position so that the probe and the specimen are contact each other at the second position, the specimen table and the probe holder are movable with respect to each other on the base table at each of the first and second positions to adjust the positional relationship between the probe and the specimen, and a measuring accuracy at the second position is superior to a measuring accuracy at the first position.
1. A defective product inspection apparatus for inspecting a product as a specimen, comprising:
a stage for holding the specimen thereon;
a specimen chamber for containing the stage therein;
a probe contactable to the specimen in the specimen chamber;
a probe holder for holding the probe thereon;
a probe exchange chamber for containing the probe holder therein;
a gate valve for connecting the specimen chamber and the probe exchange chamber to each other;
an exhauster for exhausting air from the specimen chamber and the probe exchange chamber; and
an electronic optical device for projecting a charged particle beam to the specimen,
wherein the probe holder is movable on the stage and the stage is movable between a first position in the vicinity of the electronic optical device and a second position in the vicinity of the probe exchange chamber in the specimen chamber.
2. The defective product inspection apparatus according to claim 1 , wherein the probe exchange chamber includes an exchange member for transferring the probe holder between the specimen chamber and the probe exchange chamber.
3. The defective product inspection apparatus according to claim 2 , wherein:
the probe exchange chamber is arranged above the specimen chamber; and
the exchange member is movable vertically to transfer the probe holder.
4. The defective product inspection apparatus according to claim 3 , wherein the stage is movable in the specimen chamber between a position for inspecting the specimen and another position for exchange of the probe holder.
5. The defective product inspection apparatus according to claim 2 , wherein:
the exchange member has a latch key and is rotatable; and
the probe holder has a latch catcher so that the exchange member is rotated to make the latch key engage with the latch catcher.
6. The defective product inspection apparatus according to claim 5 , wherein the stage is movable in the specimen chamber between a position for inspecting the specimen and another position for exchange of the probe holder.
7. The defective product inspection apparatus according to claim 2 , wherein the probe holder is mounted on the stage.
8. The defective product inspection apparatus according to claim 1 , wherein the exhauster includes exhauster parts independent from each other to exhaust the air from respective ones of the specimen chamber and the probe exchange chamber.
9. A defective product inspection apparatus for inspecting a product as a specimen, comprising:
an electronic optical device including an electron beam irradiator;
a movable stage for holding the specimen thereon;
a specimen chamber for containing the stage therein;
a probe contactable to the specimen in the specimen chamber;
a probe holder for holding the probe thereon;
a probe exchange chamber arranged at a position different from the electronic optical device to contain the probe holder therein; and
a gate valve for connecting the specimen chamber and the probe exchange chamber to each other,
wherein in the specimen chamber, a position of the stage obtained when exchanging the probe holder is closer to the probe exchange chamber with respect to the electronic optical device in comparison with a position of the stage obtained when inspecting the specimen, and
the probe holder is movable on the stage and the stage is movable between a first position in the vicinity of the electronic optical device and a second position in the vicinity of the probe exchange chamber in the specimen chamber.