IP Library Assignment 014572/0903
Patent Assignment
Reel/Frame 014572/0903

Assignment of Assignor's Interest

Recorded: 2003-10-02 Pages: 2
Assignors
KASUKABE, SUSUMU
Executed: 2003-09-11
HASEBE, TAKEHIKO
Executed: 2003-09-12
NARIZUKA, YASUNORI
Executed: 2003-09-11
HASEBE, AKIO
Executed: 2003-09-16
Assignee
RENESAS TECHNOLOGY CORPORATION
4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO, JAPAN
Covered Property (1)
Probe Sheet, Probe Card, Semiconductor Test Equipment and Semiconductor Device Fabrication Method
Patent: 7,049,837 →
Application: 10/676,609 →
Publication: US 2004/0070413
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Merger/Change of Name Aug 31, 2011
From: RENESAS TECHNOLOGY CORP.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 026837/0505 →