IP Library › Assignment 014587/0717
Patent Assignment
Reel/Frame 014587/0717

Assignment of Assignor's Interest

Recorded: 2003-10-14 Pages: 2
Assignors
TANAKA, MAKI
Executed: 2003-07-17
SHISHIDO, CHIE
Executed: 2003-07-18
TAKAGI, YUJI
Executed: 2003-07-17
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Method for Determining Etching Process Conditions and Controlling Etching Process
Patent: 6,984,589 →
Application: 10/460,217 →
Publication: US 2004/0040930
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →