IP Library Assignment 014686/0541
Patent Assignment
Reel/Frame 014686/0541

Assignment of Assignor's Interest

Recorded: 2003-11-14 Pages: 3
Assignor
MARUO, MASAYUKI
Executed: 2003-10-31
Assignee
SEIKO INSTRUMENTS, INC.
8, NAKASE 1-CHOME,, MIHAMA-KU, CHIBA-SHI,, CHIBA, JAPAN
Covered Property (1)
Scanning Type Charged Particle Beam Microscope
Patent: 6,683,307 →
Application: 09/910,109 →
Publication: US 2002/0017606
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 9, 2005
From: SEIKO INSTRUMENTS INC.
To: SII NANOTECHNOLOGY INC.
Reel/Frame 015711/0053 →