Patent Assignment
Reel/Frame 015711/0053
Assignment of Assignor's Interest
Recorded: 2005-02-09
Received: 2005-02-09
Pages: 9
Assignor
SEIKO INSTRUMENTS INC.
Executed: 2005-01-28
Assignee
SII NANOTECHNOLOGY INC.
8, NAKASE 1-CHOME MIHAMA-KU, CHIBA-SHIBA, CHIBA, JPX, JAPAN
Covered Properties
(36)
X-Ray Mapping Analysis Method
Application:
10/153,508 →
Focused Ion Beam Apparatus Having a Gas Injector in Which One of a Plurality of Nozzles Can Be Selectively Driven for Elevation
Application:
10/140,710 →
Focused Ion Beam Apparatus
Application:
10/055,292 →
Mask Defect Repair Method
Application:
10/047,974 →
Method of Operating Scanning Probe Microscope
Application:
10/017,123 →
Tem Sample Slicing Process
Application:
10/005,034 →
Differential Scanning Calorimeter
Application:
09/998,356 →
Scanning Electronic Beam Apparatus
Application:
10/021,332 →
Signal Detector Using Superconducting Quantum Interference Device and Measuring Method Therefore
Application:
10/021,417 →
Automatic Humidity Step Control Thermal Analysis Apparatus
Application:
10/001,335 →
Method for Forming a Vertical Edge Submicron Through-Hole and a Thin Film Sample with This Kind of Through-Hole
Application:
10/001,332 →
Superconductive Quantum Interference Element
Application:
09/944,362 →
Energy Dispersion-Type X-Ray Detection System
Application:
09/934,006 →
X-Ray Fluorescence Analyzer
Application:
09/915,447 →
Scanning Type Charged Particle Beam Microscope
Application:
09/910,109 →
X-Ray Fluorescence Analyzer
Application:
09/910,107 →
X-Ray Fluorescence Thickness Tester
Application:
09/903,236 →
Energy Dispersive X-Ray Analyzer
Application:
09/893,715 →
Scanning Probe Instrument
Application:
09/888,776 →
Surface Analyzing Apparatus
Application:
09/878,869 →
Thermal Analysis Apparatus
Application:
09/837,835 →
Open Chamber-Type X-Ray Analysis Apparatus
Application:
09/827,124 →
Portable X-Ray Fluorescence Analyzer
Application:
09/827,121 →
Portable X-Ray Fluorescence Analyzer
Application:
09/827,125 →
X-Ray Fluorescence Analysis Apparatus
Application:
09/827,123 →
Ion Beam Processing Position Correction Method
Application:
09/754,649 →
Microprobe and Scanning Probe Apparatus Having Microprobe
Application:
09/803,862 →
Probe Scanning Method
Application:
09/754,651 →
Black Defect Correction Method and Black Defect Correction Device for Photomask
Application:
09/700,638 →
Cooling Apparatus
Application:
09/780,840 →
Microprobe and Sample Surface Measuring Apparatus
Application:
09/778,459 →
Method of Forming Tunnel Oxide Film for Superconducting X-Ray Sensor Element
Application:
09/778,462 →
Photomask Correction Device
Application:
09/701,605 →
Method of Measuring Film Thickness
Application:
09/701,606 →
Calorimeter and Manufacturing Method Thereof
Application:
09/760,030 →
Method for Observing Cross-Sectional Structure of Sample
Application:
09/754,645 →