Granted Patent
Utility
US 6,703,626
· Confirmation No. 5933
MASK DEFECT REPAIR METHOD
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2003-11-24 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2003-11-24 | FRPR |
Certified Copy of Foreign Priority Application | 15 | View | |
| 2002-01-15 | TRNA |
Transmittal of New Application | 3 | View | |
| 2002-01-15 | SPEC |
Specification | 6 | View | |
| 2002-01-15 | CLM |
Claims | 1 | View | |
| 2002-01-15 | ABST |
Abstract | 1 | View | |
| 2002-01-15 | DRW |
Drawings-only black and white line drawings | 4 | View |
Inventors
Osamu Takaoka
Chiba-shi, JAPAN
Satoru Yabe
Chiba-shi, JAPAN
Classification
USPC
250/492.21
G01N23/04
G03F1/74
Prosecution
- Examiner
- HASHMI, ZIA R
- Art Unit
- 2881
- Docket No.
- S004-4518
- Confirmation No.
- 5933
Foreign Priority
2001-007370
·
2001-01-16
·
JAPAN
Publication
- Pub. No.
- US20020096635A1
- Pub. Date
- 2002-07-25
Patent Term Adjustment
-107days
No related applications found.
CHANGE OF NAME
Recorded 2014-09-25
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2005-02-09
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-11-24
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Quick Facts
- Patent No.
- US 6,703,626
- App. No.
- 10/047,974
- Filed
- 2002-01-15
- Granted
- 2004-03-09
- Pub. No.
- US20020096635A1
- Examiner
- HASHMI, ZIA R
- Art Unit
- 2881
- PTA
- -107 days
External Links