Granted Patent
Utility
US 6,584,169
· Confirmation No. 7498
X-RAY MAPPING ANALYSIS METHOD
Inventor:
Kiyoshi Hasegawa
Inventors
Kiyoshi Hasegawa
Chiba-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
378/45
G01N23/223
G01N2223/076
Prosecution
- Examiner
- CHURCH, CRAIG E
- Art Unit
- 2882
- Docket No.
- S004-4727
- Confirmation No.
- 7498
Foreign Priority
2001-173981
·
2001-06-08
·
JAPAN
Publication
- Pub. No.
- US20020186810A1
- Pub. Date
- 2002-12-12
Patent Term Adjustment
-61days
No related applications found.
CHANGE OF NAME
Recorded 2014-09-25
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2005-02-09
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Quick Facts
- Patent No.
- US 6,584,169
- App. No.
- 10/153,508
- Filed
- 2002-05-22
- Granted
- 2003-06-24
- Pub. No.
- US20020186810A1
- Examiner
- CHURCH, CRAIG E
- Art Unit
- 2882
- PTA
- -61 days
External Links