IP Library Granted Patent US 6,584,169
Granted Patent Utility
US 6,584,169 · Confirmation No. 7498

X-RAY MAPPING ANALYSIS METHOD

Inventor: Kiyoshi Hasegawa
⬇ PDF
Code Description Pages PDF
2002-05-22 TRNA Transmittal of New Application 3 View
2002-05-22 SPEC Specification 10 View
2002-05-22 CLM Claims 2 View
2002-05-22 ABST Abstract 1 View
2002-05-22 DRW Drawings-only black and white line drawings 5 View
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Quick Facts
Patent No.
US 6,584,169
App. No.
10/153,508
Filed
2002-05-22
Granted
2003-06-24
Pub. No.
US20020186810A1
Art Unit
2882
PTA
-61 days