Patent Assignment
Reel/Frame 014706/0233
Assignment of Assignor's Interest
Recorded: 2003-11-12
Pages: 2
Assignee
ADVANTEST CORPORATION
1-32, ASAHI-CHO 1-CHOME, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property
(1)
Electron Beam Exposure Apparatus, Electron Beam Exposing Method, Semiconductor Element Manufacturing Method, and Pattern Error Detection Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.