IP Library › Assignment 014740/0857
Patent Assignment
Reel/Frame 014740/0857

Assignment of Assignor's Interest

Recorded: 2003-11-19 Pages: 3
Assignor
TANNO, SHOICHI
Executed: 2003-10-24
Assignee
SHARP KABUSHIKI KAISHA
22-22, NAGAIKE-CHO, ABENO-KU, OSAKA, 545-8522, JAPAN
Covered Property (1)
Nonvolatile Semiconductor Storage Device and Row-Line Short Defect Detection Method
Patent: 7,184,305 →
Application: 10/718,440 →
Publication: US 2004/0105327
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 15, 2011
From: SHARP KABUSHIKI KAISHA
To: INTELLECTUAL PROPERTIES I KFT.
Reel/Frame 027387/0650 →
Assignment of Assignor's Interest Mar 2, 2015
From: INTELLECTUAL PROPERTIES I KFT.
To: SAMSUNG ELECTRONICS CO., LTD
Reel/Frame 035120/0878 →
Corrective Assignment to Correct the Assignee Name Previously Recorded at Reel: 035120 Frame: 0878. Assignor(S) Hereby Confirms the Assignment. Jun 5, 2015
From: INTELLECTUAL PROPERTIES I KFT.
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 035837/0619 →