Patent Assignment
Reel/Frame 014751/0981
Assignment of Assignor's Interest
Recorded: 2003-11-24
Pages: 2
Assignor
ITO, MUNEHIRO
Executed: 2003-11-17
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA 211-8668, JAPAN
Covered Property
(1)
Method for Testing Semiconductor Memory Device and Test Circuit for Semiconductor Memory Device
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.