Patent Assignment
Reel/Frame 014778/0249
Assignment of Assignor's Interest
Recorded: 2003-12-05
Pages: 5
Assignee
LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
EMST-LEITZ-STRASSE 17-37, WETZLAR, 35578, GERMANY
Covered Property
(1)
Method and microscope for detecting images of an object
Application:
10/729,588 →
Publication:
US 2004/0120579
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name
Jun 29, 2006
From: LEICA MICROSYSTEMS SEMICONDCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 017846/0823 →
Corrective Assignment to Correct the Assignor Previously Recorded on Reel 017846 Frame 0823. Assignor(S) Hereby Confirms the Change of Name
Jul 20, 2006
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018026/0297 →