Patent Assignment
Reel/Frame 017846/0823
Change of Name
Recorded: 2006-06-29
Pages: 4
Assignor
LEICA MICROSYSTEMS SEMICONDCTOR GMBH
Executed: 2006-06-02
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
ERNST-LEITZ-STRASSE 17-37, WETZLAR, 35578, GERMANY
Covered Properties
(8)
Illuminating Device
Coordinate Measuring Stage
Critical Dimension Measuring Instrument
Method and microscope for detecting images of an object
Application:
10/729,588 →
Publication:
US 2004/0120579
Apparatus for wafer inspection
Application:
11/037,668 →
Publication:
US 2005/0122509
Measuring Instrument and Method for Operating a Measuring Instrument for Optical Inspection of an Object
Method and system for inspecting a wafer
Application:
11/153,294 →
Publication:
US 2005/0280807
Method and system for inspecting a wafer WITH TELECENTRIC ILLUMINATION
Application:
11/153,646 →
Publication:
US 2005/0280808
Related Assignments
(10)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 1, 2003
From: KACZYNSKI, ULRICH
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 014355/0754 →
Assignment of Assignor's Interest
Sep 26, 2003
From: CEMIC, FRANZ; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 014545/0622 →
Assignment of Assignor's Interest
Oct 21, 2003
From: VEITH, MICHAEL; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 015100/0398 →
Assignment of Assignor's Interest
Dec 5, 2003
From: CEMIC, FRANZ; BLAESING-BANGERT, CAROLA
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 014778/0249 →
Assignment of Assignor's Interest
Jan 18, 2005
From: BACKHAUSS, HENNING
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016202/0747 →
Assignment of Assignor's Interest
May 11, 2005
From: RINN, KLAUS; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016557/0279 →
Assignment of Assignor's Interest
Jun 15, 2005
From: BACKHAUSS, HENNING; KREH, ALBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016698/0296 →
Assignment of Assignor's Interest
Jun 15, 2005
From: BACKHAUSS, HENNING; KREH, ALBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016697/0350 →
Corrective Assignment to Correct the Assignor Previously Recorded on Reel 017846 Frame 0823. Assignor(S) Hereby Confirms the Change of Name
Jul 20, 2006
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018026/0297 →
Change of Address
Jul 12, 2007
From: VISTEC SEMICONDUCTOR SYSTEMS GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 019541/0634 →