Patent Assignment
Reel/Frame 019541/0634
Change of Address
Recorded: 2007-07-12
Pages: 8
Assignor
VISTEC SEMICONDUCTOR SYSTEMS GMBH
Executed: 2007-01-22
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
KUBACHER WEG 4, WEILBURG, 35781, GERMANY
Covered Properties
(8)
Coordinate Measuring Stage and Coordinate Measuring Instrument
Illuminating Device
Coordinate Measuring Stage
Critical Dimension Measuring Instrument
Apparatus for wafer inspection
Application:
11/037,668 →
Publication:
US 2005/0122509
Measuring Instrument and Method for Operating a Measuring Instrument for Optical Inspection of an Object
Method and system for inspecting a wafer WITH TELECENTRIC ILLUMINATION
Application:
11/153,646 →
Publication:
US 2005/0280808
Apparatus and Method of Inspecting the Surface of a Wafer
Related Assignments
(11)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 20, 2002
From: BLAESING-BANGERT, CAROLA; KACZYNSKI, ULRICH
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 013214/0828 →
Assignment of Assignor's Interest
Aug 1, 2003
From: KACZYNSKI, ULRICH
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 014355/0754 →
Assignment of Assignor's Interest
Sep 26, 2003
From: CEMIC, FRANZ; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 014545/0622 →
Assignment of Assignor's Interest
Oct 21, 2003
From: VEITH, MICHAEL; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 015100/0398 →
Assignment of Assignor's Interest
Jan 18, 2005
From: BACKHAUSS, HENNING
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016202/0747 →
Assignment of Assignor's Interest
May 11, 2005
From: RINN, KLAUS; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016557/0279 →
Assignment of Assignor's Interest
Jun 15, 2005
From: BACKHAUSS, HENNING; KREH, ALBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 016698/0296 →
Change of Name
Jun 29, 2006
From: LEICA MICROSYSTEMS SEMICONDCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 017846/0823 →
Corrective Assignment to Correct the Assignor Previously Recorded on Reel 017846 Frame 0823. Assignor(S) Hereby Confirms the Change of Name
Jul 20, 2006
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018026/0297 →
Change of Name
Oct 13, 2006
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018385/0024 →
Assignment of Assignor's Interest
Nov 6, 2006
From: SULIK, WOLFGANG; HEIDEN, MICHAEL
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018484/0984 →