IP Library › Assignment 016557/0279
Patent Assignment
Reel/Frame 016557/0279

Assignment of Assignor's Interest

Recorded: 2005-05-11 Pages: 5
Assignors
RINN, KLAUS
Executed: 2005-05-06
DANNER, LAMBERT
Executed: 2005-04-29
Assignee
LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
ERNST-LEITZ-STRASSE 17-37, WETZLAR, 35578, GERMANY
Covered Property (1)
Measuring Instrument and Method for Operating a Measuring Instrument for Optical Inspection of an Object
Patent: 7,420,670 →
Application: 11/127,002 →
Publication: US 2005/0254068
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jun 29, 2006
From: LEICA MICROSYSTEMS SEMICONDCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 017846/0823 →
Corrective Assignment to Correct the Assignor Previously Recorded on Reel 017846 Frame 0823. Assignor(S) Hereby Confirms the Change of Name Jul 20, 2006
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018026/0297 →
Change of Address Jul 12, 2007
From: VISTEC SEMICONDUCTOR SYSTEMS GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 019541/0634 →