Patent Assignment
Reel/Frame 018385/0024
Change of Name
Recorded: 2006-10-13
Pages: 3
Assignor
LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Executed: 2006-02-08
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
ERNST-LEITZ-STRASSE 17-37, WETZLAR, 35578, GERMANY
Covered Property
(1)
Coordinate Measuring Stage and Coordinate Measuring Instrument
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.