IP Library Assignment 018484/0984
Patent Assignment
Reel/Frame 018484/0984

Assignment of Assignor's Interest

Recorded: 2006-11-06 Pages: 3
Assignors
SULIK, WOLFGANG
Executed: 2006-10-19
HEIDEN, MICHAEL
Executed: 2006-10-19
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
ERNST-LEITZ-STRASSE 17-37, WETZLAR, 35578, GERMANY
Covered Property (1)
Apparatus and Method of Inspecting the Surface of a Wafer
Patent: 7,545,489 →
Application: 11/463,471 →
Publication: US 2007/0052954
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Address Jul 12, 2007
From: VISTEC SEMICONDUCTOR SYSTEMS GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 019541/0634 →