IP Library Granted Patent US 7,268,940
Granted Patent B2
US 7,268,940 · App. 10/475,559 · Granted Sep 11, 2007

Illuminating device

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Quick Facts
Patent No.
US 7,268,940
App. No.
10/475,559
Granted
Sep 11, 2007
Kind
B2
Abstract

An illuminating device, as for a microscope, includes a light source and a reflecting filter system. The beam of light of the light source undergoes a plurality of reflections in the reflecting filter system. The entering beam of the reflecting filter system has an optical beam offset and/or a change in direction relative to the exiting beam.

Claims (27)

1. An illuminating device comprising:

a light source configured to provide a beam of light;

a housing;

a first reflecting filter system disposed in the housing and including at least four first reflecting notch filters configured to reflect light having a wavelength of 365 nm;

a second reflecting filter system disposed in the housing and including at least four second reflecting notch filters designed to reflect light having a wavelength of 248 nm; and

a plate disposed in the housing and configured to selectively, one at a time, bring the first reflecting filter system and the second reflecting filter system into the beam of light;

wherein each of the first and second reflecting filter systems is configured so that the beam of light undergoes at least four reflections in the respective reflecting filter system and an entering beam of the respective reflecting filter system has an optical beam offset relative to an exiting beam thereof the entering beam being parallel to the exiting beam.

2. The illuminating device as recited in claim 1 wherein the illuminating device is configured for use in a microscope.

3. The illuminating device as recited in claim 2 wherein the microscope is a UV microscope.

4. The illuminating device as recited in claim 1 wherein a respective angle of reflection is at least nearly the same for each of the at least four reflections.

5. The illuminating device as recited in claim 1 wherein the plate is rotatable so as to enable the selectively, one at a time, bringing the first reflecting filter system and the second reflecting filter system into the beam of light so as to select a wavelength of light of the light source.

6. The illuminating device as recited in claim 5 further comprising at least one of a mechanical and a motor-driven switching mechanism for rotating the plate.

7. The illuminating device as recited in claim 1 wherein the light source is disposed in the housing.

8. The illuminating device as recited in claim 7 wherein the housing has a standard mechanical interface.

9. The illuminating device as recited in claim 1 wherein the light propagates in an at least substantially collimated manner at least one of when in the reflecting filter system and when exiting the reflecting filter system.

10. The illuminating device as recited in claim 1 , further comprising a beam-shaping device disposed in at least one of a beam path of at least one of the first and second reflecting filter systems and in the housing.

11. The illuminating device as recited in claim 10 wherein the beam-shaping device includes a lens.

12. The illuminating device as recited in claim 1 further comprising at least one of a passive and an active cooling device associated with at least one of the first and second reflecting filter systems.

13. A microscope comprising an illuminating device, the illuminating device comprising:

a light source configured to provide a beam of light;

a housing;

a first reflecting filter system disposed in the housing and including at least four first reflecting notch filters configured to reflect light having a wavelength of 365 nm;

a second reflecting filter system disposed in the housing and including at least four second reflecting notch filters designed to reflect light having a wavelength of 248 nm; and

a plate disposed in the housing and configured to selectively, one at a time, bring the first reflecting filter system and the second reflecting filter system into the beam of light;

wherein each of the first and second reflecting filter systems is configured so that the beam of light undergoes at least four reflections in the respective reflecting filter system and an entering beam of the respective reflecting filter system has an optical beam offset relative to an exiting beam thereof, the entering beam being parallel to the exiting beam.

14. The illuminating device as recited in claim 13 wherein the housing has a standard mechanical interface.

15. The microscope as recited in claim 13 wherein the microscope is at least one of a semiconductor inspection and a semiconductor measuring microscope.

Assignments (4)
CHANGE OF ADDRESS Recorded Jul 12, 2007
From: VISTEC SEMICONDUCTOR SYSTEMS GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 019541/0634 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNOR PREVIOUSLY RECORDED ON REEL 017846 FRAME 0823. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME Recorded Jul 20, 2006
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 018026/0297 →
CHANGE OF NAME Recorded Jun 29, 2006
From: LEICA MICROSYSTEMS SEMICONDCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 017846/0823 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 21, 2003
From: VEITH, MICHAEL; DANNER, LAMBERT
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 015100/0398 →