Patent Assignment
Reel/Frame 014846/0087
Assignment of Assignor's Interest
Recorded: 2003-12-24
Pages: 2
Assignee
SHARP KABUSHIKI KAISHA
22-22, NAGAIKE-CHO, ABENO-KU, OSAKA-SHI, OSAKA, 545-8522, JAPAN
Covered Property
(1)
Logic Circuit Test Apparatus and Logic Circuit Test Method