Patent Assignment
Reel/Frame 014884/0707
Assignment of Assignor's Interest
Recorded: 2004-01-14
Pages: 3
Assignors
WANG, SEONGMOON
Executed: 2003-10-06
LIU, XIAO
Executed: 2003-10-01
CHAKRADHAR, SRIMAT T.
Executed: 2003-10-06
Assignee
NEC LABORATORIES AMERICA, INC.
4 INDEPENDENCE WAY, PRINCETON, NEW JERSEY, 08540
Covered Property
(1)
Hybrid Scan-Based Delay Testing Technique for Compact and High Fault Coverage Test Set
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.