IP Library Assignment 020487/0759
Patent Assignment
Reel/Frame 020487/0759

Assignment of Assignor's Interest

Recorded: 2008-02-12 Pages: 5
Assignor
NEC LABORATORIES AMERICA, INC.
Executed: 2008-02-12
Assignee
NEC CORPORATION
7-1 SHIBA, MINATO-KU, TOKYO, 108-0005, JAPAN
Covered Properties (19)
Method for Retrieving Answers from an Information Retrieval System
Patent: 7,269,545 →
Application: 09/823,052 →
Publication: US 2002/0169595
Extracting Classifying Data in Music from an Audio Bitstream
Patent: 7,295,977 →
Application: 09/939,954 →
Publication: US 2003/0040904
Inferring Hierarchical Descriptions of a Set of Documents
Patent: 7,165,024 →
Application: 10/209,594 →
Publication: US 2003/0167163
Hybrid Scan-Based Delay Testing Technique for Compact and High Fault Coverage Test Set
Patent: 7,313,743 →
Application: 10/653,959 →
Publication: US 2005/0066242
Scheduling Method with Tunable Throughput Maximization and Fairness Guarantees in Resource Allocation
Patent: 7,230,991 →
Application: 10/731,962 →
Publication: US 2005/0130664
System-Level Test Architecture for Delivery of Compressed Tests
Patent: 7,278,123 →
Application: 10/795,231 →
Publication: US 2005/0097413
Efficient Distributed Sat and Sat-Based Distributed Bounded Model Checking
Patent: 7,203,917 →
Application: 10/795,384 →
Publication: US 2004/0210860
Peer-To-Peer System and Method with Prefix-Based Distributed Hash Table
Patent: 7,304,994 →
Application: 10/813,504 →
Publication: US 2005/0135381
Load-Aware Handoff and Site Selection Scheme
Patent: 7,310,526 →
Application: 10/838,792 →
Publication: US 2005/0176440
Compressed Memory Architecture for Embedded Systems
Patent: 7,302,543 →
Application: 10/869,985 →
Publication: US 2006/0101223
Externally-Loaded Weighted Random Test Pattern Compression
Patent: 7,284,176 →
Application: 10/891,618 →
Publication: US 2006/0015787
Restricted Scan Reordering Technique to Enhance Delay Fault Coverage
Patent: 7,188,323 →
Application: 10/892,022 →
Publication: US 2005/0235183
Test Output Compaction Using Response Shaper
Patent: 7,222,277 →
Application: 10/985,599 →
Publication: US 2006/0101316
Efficient Sat-Based Unbounded Symbolic Model Checking
Patent: 7,305,637 →
Application: 11/087,898 →
Publication: US 2005/0240885
Flexible Waveband Aggregator and Deaggregator and Hierarchical Hybrid Optical Cross-Connect System
Patent: 7,239,772 →
Application: 11/095,220 →
Publication: US 2005/0281504
Test Pattern Compression with Pattern-Independent Design-Independent Seed Compression
Patent: 7,302,626 →
Application: 11/095,222 →
Publication: US 2006/0112320
Synergistic Face Detection and Pose Estimation with Energy-Based Models
Patent: 7,236,615 →
Application: 11/095,984 →
Publication: US 2006/0034495
Test Output Compaction for Responses with Unknown Values
Patent: 7,313,746 →
Application: 11/277,782 →
Publication: US 2007/0088999
Power Estimation Employing Cycle-Accurate Functional Descriptions
Patent: 7,260,809 →
Application: 11/278,182 →
Publication: US 2007/0022395
Related Assignments (18)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jul 16, 2001
From: AGICHTEIN, YEVGENY; LAWRENCE, STEPHEN R.
To: NEC RESEARCH INSTITUTE, INC.
Reel/Frame 011978/0042 →
Assignment of Assignor's Interest Aug 27, 2001
From: WHITMAN, BRIAN; FLAKE, GARY W.; LAWRENCE, STEPHEN R.
To: NEC RESEARCH INSTITUTE, INC.
Reel/Frame 012136/0670 →
Assignment of Assignor's Interest Sep 9, 2002
From: GLOVER, ERIC J.; LAWRENCE, STEPHEN M.; PENNOCK, DAVID M.
To: NEC RESEARCH INSTITUTE, INC.
Reel/Frame 013270/0880 →
Change of Name Dec 31, 2002
From: NEC RESEARCH INSTITUTE, INC.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 013599/0895 →
Assignment of Assignor's Interest Dec 10, 2003
From: SANG, AIMIN; WANG, XIAODONG; MADIHIAN, MOHAMMAD
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014807/0140 →
Assignment of Assignor's Interest Jan 14, 2004
From: WANG, SEONGMOON; LIU, XIAO; CHAKRADHAR, SRIMAT T.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014884/0707 →
Assignment of Assignor's Interest Mar 30, 2004
From: DUBNICKI, CEZARY; UNGUREANU, CRISTIAN
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 015164/0458 →
Assignment of Assignor's Interest Jun 22, 2004
From: GANAI, MALAY; GUPTA, AARTI; YANG, ZIJIANG; ASHAR, PRANAV
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014759/0163 →
Assignment of Assignor's Interest Jul 13, 2004
From: RAVI, SRIVATHS; RAGHUNATHAN, ANAND; LINGAPPAN, LOGANATHAN; CHAKRADHAR, SRIMAT T.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014841/0030 →
Assignment of Assignor's Interest Jul 15, 2004
From: WANG, SEONGMOON; LI, WEI; CHAKRADHAR, SRIMAT T.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 015579/0540 →
Assignment of Assignor's Interest Jul 15, 2004
From: WANG, SEONGMOON; CHAKRADHAR, SRIMAT T.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 015579/0794 →
Assignment of Assignor's Interest Aug 11, 2004
From: LEKATSAS, HARIS; HENKEL, JOERG; CHAKRADHAR, SRIMAT; JAKKULA, VENKATA
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014973/0001 →
Assignment of Assignor's Interest Aug 17, 2004
From: SANG, AIMIN; WANG, XIAODONG
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 014996/0560 →
Assignment of Assignor's Interest Mar 23, 2005
From: WANG, SEONGMOON; CHAKRADHAR, SRIMAT T; CHAO, CHIA-TSO
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 015811/0420 →
Assignment of Assignor's Interest Mar 23, 2005
From: GANAI, MALAY K.; GUPTA, AARTI; ASHAR, PRANAV
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016406/0764 →
Assignment of Assignor's Interest May 9, 2005
From: BALAKRISHNAN, KEDARNATH; WANG, SEONGMOON; CHAKRADHAR, SRIMAT T.
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 015982/0828 →
Assignment of Assignor's Interest May 31, 2005
From: MATSUDA, OSAMU
To: NEC CORPORATION
Reel/Frame 016075/0159 →
Assignment of Assignor's Interest May 31, 2005
From: WANG, TING; JI, PHILIP NAN; ZONG, LANE
To: NEC LABORATORIES AMERICA, INC.
Reel/Frame 016075/0156 →