Test pattern compression with pattern-independent design-independent seed compression
The present invention is directed to a logic testing architecture with an improved decompression engine that compresses the seeds of a linear test pattern generator in a manner that is independent of the test pattern set.
1. A method of generating a test pattern for a logic testing architecture, the method comprising:
storing one or more previous seed values;
decoding a compressed representation of a current seed which is encoded as a function of the one or more previous seeds; and
seeding a test pattern generator with the decoded current seed, thereby generating a test pattern for the logic testing architecture, wherein the compressed representation of the current seed encodes differences between the current seed and the one or more previous seeds.
2. The method of claim 1 , wherein the current seed is selected from a solution space of possible seed values for the test pattern generator which minimizes the differences between the current seed and the one or more previous seeds.
3. The method of claim 1 , wherein the one or more previous seed values are stored in a shadow register and wherein the current seed is decoded by modifying the shadow register.
4. The method of claim 1 , wherein the test pattern generator is a linear test pattern generator.
5. The method of claim 4 , wherein the linear test pattern generator is a linear feedback shift register.
6. The method of claim 4 , wherein the linear test pattern generator is a linear hybrid cellular automata.
7. A method of generating a test pattern for a logic testing architecture, the method comprising:
decoding a compressed representation of a seed for a test pattern generator which is encoded as a function of a last state of the test pattern generator; and
seeding the test pattern generator with the decoded seed, thereby generating a test pattern for the logic testing architecture, wherein the compressed representation of the current seed encodes differences between the seed and the last state of the test pattern generator.
8. The method of claim 7 , wherein the test pattern generator is a linear test pattern generator.
9. The method of claim 8 , wherein the linear test pattern generator is a linear feedback shift register.
10. The method of claim 8 , wherein the linear test pattern generator is a linear hybrid cellular automata.
11. A method of generating a test pattern for a logic testing architecture, the method comprising:
storing one or more previous seed values;
decoding a compressed representation of a current seed which is encoded as a function of the one or more previous seeds; and
seeding a test pattern generator with the decoded current seed, thereby generating a test pattern for the logic testing architecture, wherein the current seed is selected from a solution space of possible seed values for the test pattern generator which optimizes the compressed representation of the current seed.