IP Library Assignment 014913/0426
Patent Assignment
Reel/Frame 014913/0426

Assignment of Assignor's Interest

Recorded: 2004-01-23 Pages: 3
Assignor
NEC CORPORATION
Executed: 2004-01-05
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI-KANAGAWA 211-8668, JAPAN
Covered Properties (3)
Integrated Circuit Fault Testing System Based on Power Spectrum Analysis of Power Supply Current
Patent: 5,949,798 →
Application: 08/795,354 →
Diagnostic System Analyzing Frequency Spectrum of Electric Power for Diagnosing Integrated Circuit, Method and Information Storage Medium Storing Computer Program for the Method
Patent: 6,058,502 →
Application: 09/145,236 →
High Speed Lsi Spectral Analysis Testing Apparatus and Method
Patent: 6,351,835 →
Application: 09/365,170 →
Related Assignments (6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 4, 1997
From: SAKAGUCHI, KAZUHIRO
To: NEC CORPORATION
Reel/Frame 008467/0032 →
Assignment of Assignor's Interest Sep 1, 1998
From: SAKAGUCHI, KAZUHIRO
To: NEC CORPORATION
Reel/Frame 009435/0913 →
Assignment of Assignor's Interest Aug 2, 1999
From: SAKAGUCHI, KAZUHIRO
To: NEC CORPORATION
Reel/Frame 010147/0865 →
Change of Name Oct 21, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025173/0161 →
Change of Name Oct 25, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025185/0597 →
Change of Name Nov 18, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025375/0948 →