IP Library › Assignment 014954/0092
Patent Assignment
Reel/Frame 014954/0092

Change of Assignee

Recorded: 2004-01-27 Pages: 4
Assignors
NIKON CORPORATION
Executed: 2003-12-24
EBARA CORPORATION
Executed: 2003-12-24
Assignee
EBARA CORPORATION
11-1, HANEDA ASAHI-CHO, OHTA-KU, TOKYO, JAPAN
Covered Property (1)
Inspection System by Charged Particle Beam and Method of Manufacturing Devices Using the System
Patent: 7,135,676 →
Application: 09/891,611 →
Publication: US 2002/0033449
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 22, 2001
From: NAKASUJI, MAMORU; NOJI, NOBUHARU; SATAKE, TOHRU; KIMBA, TOSHIFUMI
To: EBARA CORPORATION; NIKON CORPORATION
Reel/Frame 012272/0431 →
Corrective Recording to Correct the 7TH and 9TH Assignors Names, Filed on 10-22-2001 Recorded on Reel 012272 Frame 0431. Apr 12, 2002
From: NAKASUJI, MAMORU; NOJI, NOBUHARU; SATAKE, TOHRU; KIMBA, TOSHIFUMI
To: EBARA CORPORATION; NIKON CORPORATION
Reel/Frame 012786/0722 →