Patent Assignment
Reel/Frame 015037/0283
Assignment of Assignor's Interest
Recorded: 2004-02-27
Pages: 2
Assignors
SHIN, KOUNG-SU
Executed: 2004-02-12
CHOI, SUN-YONG
Executed: 2004-02-13
JUN, CHUNG-SAM
Executed: 2004-02-16
LEE, DONG-CHUN
Executed: 2004-02-12
YOON, KWANG-JUN
Executed: 2004-02-20
Assignee
SAMSUNG ELECTRONICS CO., LTD.
416, MAETAN-DONG, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Method and Apparatus for Inspecting an Edge Exposure Area of a Wafer