Patent Assignment
Reel/Frame 015062/0045
Assignment of Assignor's Interest
Recorded: 2004-08-13
Pages: 3
Assignee
SEIKO EPSON CORPORATION
4-1, NISHI-SHINJUKU 2-CHOME, SHINJUKU-KU,, TOKYO,, JAPAN
Covered Property
(1)
An Integrated Test Circuit, a Test Circuit, and a Test Method for Performing Transmission and Reception Processing to and from a First and a Second Macro Block at a First Frequency
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.