Patent Assignment
Reel/Frame 015174/0242
Assignment of Assignor's Interest
Recorded: 2003-11-12
Pages: 2
Assignor
YAMANE, TOMOYUKI
Executed: 2003-10-29
Assignee
ADVANTEST CORPORATION
1-32, ASAHI-CHO 1-CHOME, NERIMA-KU, TOKYO, 179-0071, JAPAN
Covered Property
(1)
Semiconductor Memory Test Apparatus and Method for Address Generation for Defect Analysis
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.