Patent Assignment
Reel/Frame 015221/0548
Assignment of Assignor's Interest
Recorded: 2004-04-15
Pages: 2
Assignors
MIYAI, HIROSHI
Executed: 2003-11-25
FUNATSU, RYUCHI
Executed: 2003-11-26
NINOMIYA, TAKU
Executed: 2003-11-25
NARA, YASUHIKO
Executed: 2003-11-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Inspection Method and Apparatus Using an Electron Beam