IP Library › Assignment 015248/0721
Patent Assignment
Reel/Frame 015248/0721

Assignment of Assignor's Interest

Recorded: 2003-10-23 Pages: 3
Assignor
EISENKRAMER, FRANK
Executed: 2003-10-21
Assignee
LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
ERNST-LEITZ-STRASSE 17-37, 35578 WETZLAR, GERMANY
Covered Property (1)
Inspection Microscope for Several Wavelength Ranges and Reflection Reducing Layer for an Inspection Microscope for Several Wavelength Ranges
Patent: 7,274,505 →
Application: 10/475,653 →
Publication: US 2004/0145803
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 15, 2005
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 016536/0330 →
Change of Name Jul 5, 2007
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: VISTEC SEMICONDUCTOR SYSTEMS GMBH
Reel/Frame 019518/0204 →