IP Library › Assignment 019518/0204
Patent Assignment
Reel/Frame 019518/0204

Change of Name

Recorded: 2007-07-05 Pages: 8
Assignor
Assignee
VISTEC SEMICONDUCTOR SYSTEMS GMBH
KUBACHER WEG 4, WEILBURG, 35781, GERMANY
Covered Property (1)
Inspection Microscope for Several Wavelength Ranges and Reflection Reducing Layer for an Inspection Microscope for Several Wavelength Ranges
Patent: 7,274,505 →
Application: 10/475,653 →
Publication: US 2004/0145803
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Oct 23, 2003
From: EISENKRAMER, FRANK
To: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
Reel/Frame 015248/0721 →
Assignment of Assignor's Interest Sep 15, 2005
From: LEICA MICROSYSTEMS SEMICONDUCTOR GMBH
To: LEICA MICROSYSTEMS CMS GMBH
Reel/Frame 016536/0330 →