Patent Assignment
Reel/Frame 015363/0442
Assignment of Assignor's Interest
Recorded: 2004-05-21
Pages: 3
Assignee
HYNIX SEMICONDUCTOR INC.
SAN 136-1, AMI-RI, BUBAL-EUB, ICH'ON, KYOUNGKI-DO, KOREA, REPUBLIC OF
Covered Property
(1)
Method for Screening Failure of Memory Cell Transistor
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.