IP Library › Assignment 015376/0963
Patent Assignment
Reel/Frame 015376/0963

Assignment of Assignor's Interest

Recorded: 2004-05-26 Pages: 3
Assignors
TSUCHIYA, HIDEO
Executed: 2004-01-14
KATO, YOSHIHIDE
Executed: 2004-01-14
MATSUKI, KAZUTO
Executed: 2004-01-14
SANADA, YASUSHI
Executed: 2004-01-14
OGAWA, RIKI
Executed: 2004-01-14
NAGAO, TAKURO
Executed: 2004-01-14
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Pattern Inspecting Method and Pattern Inspecting Apparatus
Patent: 7,359,043 →
Application: 10/743,830 →
Publication: US 2004/0184652
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
De-Merger Dec 12, 2019
From: KABUSHIKI KAISHA TOSHIBA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051260/0291 →
Merger Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION; K.K PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 051262/0776 →
Change of Name and Address Dec 12, 2019
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 051262/0881 →