Patent Assignment
Reel/Frame 015397/0025
Assignment of Assignor's Interest
Recorded: 2004-05-26
Pages: 3
Assignor
MATSUMOTO, KYOZO
Executed: 2004-05-18
Assignee
SHARP KABUSHIKI KAISHA
22-22, NAGAIKE-CHO, ABENO-KU, OSAKA-SHI, OSAKA, 545-8522, JAPAN
Covered Property
(1)
Device Test Apparatus and Test Method Including Control Unit(S) Between Controller and Test Units