IP Library Assignment 015439/0757
Patent Assignment
Reel/Frame 015439/0757

Assignment of Assignor's Interest

Recorded: 2004-06-09 Pages: 3
Assignor
KIMURA, RYOHEI
Executed: 2004-04-20
Assignee
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property (1)
Fuse Trimming Failure Test Circuit for Cmos Circuit
Patent: 6,774,702 →
Application: 10/188,685 →
Publication: US 2003/0006466
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 10, 2016
From: SEIKO INSTRUMENTS INC.
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 038058/0892 →
Change of Name Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →