Patent Assignment
Reel/Frame 015450/0552
Assignment of Assignor's Interest
Recorded: 2004-06-09
Pages: 3
Assignors
TAKEUCHI, SHUICHI
Executed: 2004-01-30
NAKAGAWA, MINE
Executed: 2004-01-30
SATO, MITSUGU
Executed: 2004-02-04
TAKANE, ATSUSHI
Executed: 2004-02-04
NIMURA, KAZUTAKA
Executed: 2004-02-03
Assignees
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHIMBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
HITACHI SCIENCE SYSTEMS, LTD.
1040, ICHIGE, HITACHINAKA-SHI, IBARAKI 312-0033, JAPAN
Covered Property
(1)
Scanning Electron Microscope and Sample Observing Method Using It
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.