IP Library Assignment 015520/0226
Patent Assignment
Reel/Frame 015520/0226

Assignment of Assignor's Interest

Recorded: 2004-06-30 Pages: 3
Assignors
DISHON, GIORA
Executed: 2004-02-05
FINAROV, MOSHE
Executed: 2004-02-05
COHEN, YOEL
Executed: 2004-02-05
NIREL, ZVI
Executed: 2004-02-05
Assignee
NOVA MEASURING INSTRUMENTS LTD.
P.O. B. 266, WEIZMANN SCIENTIFIC PARK, REHOVOT 76100, ISRAEL
Covered Property (1)
Monitoring Apparatus and Method Particularly Useful in Photolithographically Processing Substrates
Patent: 7,030,957 →
Application: 10/763,383 →
Publication: US 2004/0191652
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name May 23, 2023
From: FROM NOVA MEASURING INSTRUMENTS LTD.
To: NOVA LTD.
Reel/Frame 063724/0340 →